Electron Microscopy

Electron microscopy uses a beam of electrons to observe samples at very high resolution, far beyond the limits of optical microscopy. It allows analysis of both the surface and the internal ultrastructure of samples at the nanometer scale.

Quanta FEG from FEI Scanning Electron Microscopy (SEM)

SEM produces detailed images of sample surfaces with great depth of field. This technique is particularly well suited for studying the morphology and topography of materials and biological structures.

Tecnai 10 100 kV from FEI Transmission Electron Microscopy (TEM)

TEM (Transmission Electron Microscopy) allows observation of the internal organization of samples using ultra-thin sections through which an electron beam passes. It provides very high resolution for analyzing cellular and nanometer-scale structures.

Talos FEG 200 kV from TFS, equipped with Falcon III camera for cryogenic TEM

By combining high detective quantum efficiency (DQE) with improved sensitivity, direct electron detector further extends the capabilities of cryo-TEM for single-particle structural studies and facilitate the characterization of smaller and more heterogeneous particles. It also supports cryo-electron tomography applications, enabling three-dimensional visualization of macromolecular complexes in native or cellular contexts.